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Power-Aware Testing and Test Strategies for Low Power Devices

by Patrick Girard, Nicola Nicolici, Xiaoqing Wen

ISBN 13: 9781441909275

Format: Hardcover (353 pages)
Publisher: Springer
Published: 23 Nov 2009

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VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

by Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen

ISBN 13: 9780123705976

Format: Hardcover (808 pages)
Publisher: Morgan Kaufmann
Published: 14 Aug 2006

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