VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

by Laung - Terng Wang (Author), XiaoqingWen (Author), Cheng - Wen Wu (Author)

• New

  Hardcover
  2006

  $63.96

  A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.