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Fiber Optic Measurement Techniques Fiber Optic Measurement Techniques by Rongqing Hui Ph.D. Electrical Engineering Politecnico di Torino Torino Italy Professor,Maurice O'Sullivan

Fiber Optic Measurement Techniques

by Rongqing Hui Ph.D. Electrical Engineering Politecnico di Torino Torino Italy Professor,Maurice O'Sullivan


ISBN 13: 9780123738653

Format: Illustrated (672 pages)
Publisher: Academic Press
Published: 26 Jan 2009

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Silicon Earth: Introduction to the Microelectronics and Nanotechnology Revolution Silicon Earth: Introduction to the Microelectronics and Nanotechnology Revolution by John D. Cressler

Silicon Earth: Introduction to the Microelectronics and Nanotechnology Revolution

by John D. Cressler


ISBN 13: 9780521705059

Format: Paperback (508 pages)
Publisher: Cambridge University Press
Published: 17 Aug 2009
Other Format: Illustrated

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New : $54.06  
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OPTICAL PROPERTIES AND SPECTROSCOPY OF NANOMATERIALS OPTICAL PROPERTIES AND SPECTROSCOPY OF NANOMATERIALS by ZHANG JIN ZHONG

OPTICAL PROPERTIES AND SPECTROSCOPY OF NANOMATERIALS

by ZHANG JIN ZHONG


ISBN 13: 9789812836656

Format: Paperback (400 pages)
Publisher: World Scientific Publishing
Published: 21 Sep 2009
Other Format: Illustrated

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New : $72.81  
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Light Scattering by Optically Soft Particles: Theory and Applications (Springer Praxis Books / Environmental Sciences) Light Scattering by Optically Soft Particles: Theory and Applications (Springer Praxis Books / Environmental Sciences) by Subodh K. Sharma,David J. Sommerford

Light Scattering by Optically Soft Particles: Theory and Applications (Springer Praxis Books / Environmental Sciences)

by Subodh K. Sharma,David J. Sommerford


ISBN 13: 9783540239109

Format: Hardcover (211 pages)
Publisher: Springer
Published: 06 Jun 2006

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New : $114.17  
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics) High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics) by Ullrich Pietsch,Vaclav Holy,Tilo Baumbach

High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)

by Ullrich Pietsch,Vaclav Holy,Tilo Baumbach


ISBN 13: 9780387400921

Format: Hardcover (408 pages)
Publisher: Springer
Published: 29 Sep 2004

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New : $87.63  
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Laser Doppler and Phase Doppler Measurement Techniques (Experimental Fluid Mechanics) Laser Doppler and Phase Doppler Measurement Techniques (Experimental Fluid Mechanics) by H.-E. Albrecht,Nils Damaschke,Michael Borys,Cameron Tropea

Laser Doppler and Phase Doppler Measurement Techniques (Experimental Fluid Mechanics)

by H.-E. Albrecht,Nils Damaschke,Michael Borys,Cameron Tropea


ISBN 13: 9783540678380

Format: Hardcover (750 pages)
Publisher: Springer
Published: 14 Nov 2002

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New : $447.16  
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Singularities of Caustics and Wave Fronts (Mathematics and its Applications) Singularities of Caustics and Wave Fronts (Mathematics and its Applications) by Vladimir Arnold

Singularities of Caustics and Wave Fronts (Mathematics and its Applications)

by Vladimir Arnold


ISBN 13: 9781402003332

Format: Paperback (276 pages)
Publisher: Springer
Published: 30 Nov 2001
Other Format: Hardcover

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New : $124.90  
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