High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)

by UllrichPietsch (Author), VaclavHoly (Author), TiloBaumbach (Author)

• New

  Hardcover
  2004

  $85.95

  During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.