Tracking Environmental Change Using Lake Sediments: Volume 3: Terrestrial, Algal, and Siliceous Indicators: Terrestrial, Algal and Siliceous ... (Developments in Paleoenvironmental Research)
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ISBN 13: 9781402006814
Format: Hardcover (400 pages) Publisher: Springer Published: 30 Jun 2002
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Low-Temperature Microscopy and Analysis
by Patrick Echlin
ISBN 13: 9780306439841
Format: Hardcover (568 pages) Publisher: Springer Published: 31 Mar 1992
Scientific Computer Performance (Chapman & Hall/CRC Computational Science)
ISBN 13: 9781439815694
Format: Hardcover (399 pages) Publisher: CRC Press Published: 01 Feb 2011
Scanning Transmission Electron Microscopy: Imaging and Analysis
ISBN 13: 9781441971999
Format: Hardcover (774 pages) Publisher: Springer Published: 22 Mar 2011
Biological Low-Voltage Scanning Electron Microscopy
ISBN 13: 9780387729701
Format: Hardcover (328 pages) Publisher: Springer Published: 14 Jan 2008
Advances in Imaging and Electron Physics: 165 (Advances in Imaging & Electron Physics)
ISBN 13: 9780123858610
Format: Hardcover (360 pages) Publisher: Academic Press Published: 29 Mar 2011
Scanning Electron Microscope Optics and Spectrometer
by Anjam Khursheed
ISBN 13: 9789812836670
Format: Hardcover (416 pages) Publisher: World Scientific Publishing Co Pte Ltd Published: 01 Nov 2009
Optical Fluorescence Microscopy: From the Spectral to the Nano Dimension
ISBN 13: 9783642151743
Format: Hardcover (244 pages) Publisher: Springer Published: 30 Nov 2010
Broadband Dielectric Spectroscopy
ISBN 13: 9783540434078
Format: Hardcover (729 pages) Publisher: Springer Published: 13 Nov 2002
Scientific Computing with Multicore and Accelerators (Chapman & Hall/CRC Computational Science)
ISBN 13: 9781439825365
Format: Hardcover (514 pages) Publisher: CRC Press Published: 14 Dec 2010
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques: No. 8 (NanoScience and Technology)
ISBN 13: 9783540740797
Format: Hardcover (525 pages) Publisher: Springer Published: 10 Jan 2008 Other Format: Hardcover
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by R.F. Egerton
ISBN 13: 9780387258003
Format: Hardcover (202 pages) Publisher: Springer Published: 01 May 2008