Applied Scanning Probe Methods I: v. 1 (NanoScience and Technology)

Applied Scanning Probe Methods I: v. 1 (NanoScience and Technology)

by HaraldFuchs (Editor), Bharat Bhushan (Editor), SumioHosaka (Editor)

Synopsis

This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.

$255.31

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 496
Edition: illustrated edition
Publisher: Springer
Published: 13 Jan 2004

ISBN 10: 3540005277
ISBN 13: 9783540005278