Applied Scanning Probe Methods I: v. 1 (NanoScience and Technology)

by HaraldFuchs (Editor), Bharat Bhushan (Editor), SumioHosaka (Editor)

• New

  Hardcover
  2004

  $263.62

  This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.

• New

  Hardcover
  2008

  $251.66

  The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.