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Scanning and Transmission Electron Microscopy: An Introduction Scanning and Transmission Electron Microscopy: An Introduction by Stanley L. Flegler,John W. Heckman Jr,Karen L. Klomparens

Scanning and Transmission Electron Microscopy: An Introduction

by Stanley L. Flegler,John W. Heckman Jr,Karen L. Klomparens


ISBN 13: 9780195107517

Format: Hardcover (240 pages)
Publisher: OUP USA
Published: 21 Aug 1997

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Used : $31.45  
 
Used : $31.45