Buy Used and New JoséPinedadeGyvez Books

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev,José Pineda de Gyvez

ISBN 13: 9780387465463

Format: Hardcover (349 pages)
Publisher: Springer
Published: 04 Jun 2007

Save for later

Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Analog Circuits and Signal Processing)

by Amir Zjajo,José Pineda de Gyvez

ISBN 13: 9789048197248

Format: Hardcover (250 pages)
Publisher: Springer
Published: 05 Nov 2010

Save for later