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Hot-Carrier Effects in MOS Devices Hot-Carrier Effects in MOS Devices by Eiji Takeda,Cary Y. Yang,Akemi Miura-Hamada

Hot-Carrier Effects in MOS Devices

by Eiji Takeda,Cary Y. Yang,Akemi Miura-Hamada


ISBN 13: 9780126822403

Format: Hardcover (312 pages)
Publisher: Academic Press
Published: 28 Nov 1995

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