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Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering) Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering) by John H. Lau

Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering)

by John H. Lau


ISBN 13: 9780071753791

Format: Hardcover (640 pages)
Publisher: McGraw-Hill Professional
Published: 01 Dec 2010

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New : $141.46  
New : $141.46