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VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) by Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

by Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen


ISBN 13: 9780123705976

Format: Hardcover (808 pages)
Publisher: Morgan Kaufmann
Published: 14 Aug 2006

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New : $69.79