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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael

by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael

ISBN 13: 9781461349693

Format: Paperback (708 pages)
Publisher: Springer
Published: 31 May 2013


New : $82.54

New : $82.54

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