Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Linda Sawyer (Author), Linda Sawyer (Author), Joseph Goldstein (Author), Charles E. Lyman (Author), Dale E. Newbury (Author), David C. Joy (Author), Eric Lifshin (Author), J.R. Michael (Author), Patrick Echlin (Author)

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Paperback
2013
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Format: Paperback
Pages: 708
Edition: 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Publisher: Springer
Published: 31 May 2013
ISBN 10: 1461349699
ISBN 13: 9781461349693