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Polymer Microscopy: Characterization and Evaluation of Materials

by Linda Sawyer,David T. Grubb,Gregory F. Meyers

ISBN 13: 9780387726274

Format: Hardcover (416 pages)
Publisher: Springer
Published: 21 Jul 2008

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael

ISBN 13: 9781461349693

Format: Paperback (708 pages)
Publisher: Springer
Published: 31 May 2013

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