Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
by David H. Krinsley, Kenneth Pye, Sam Boggs Jr, N. Keith Tovey
ISBN 13: 9780521453462
Format: Hardcover (203 pages) Publisher: Cambridge University Press Published: 13 Jul 1998
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ISBN 13: 9780521019743
Format: Paperback (204 pages) Publisher: Cambridge University Press Published: 15 Sep 2005