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Reliability of Microtechnology: Interconnects, Devices and Systems Reliability of Microtechnology: Interconnects, Devices and Systems by Johan Liu,Olli Salmela,Jussi Sarkka,James E. Morris,Per-Erik Tegehall,Cristina Andersson

Reliability of Microtechnology: Interconnects, Devices and Systems

by Johan Liu,Olli Salmela,Jussi Sarkka,James E. Morris,Per-Erik Tegehall,Cristina Andersson


ISBN 13: 9781441957597

Format: Hardcover (217 pages)
Publisher: Springer
Published: 14 Feb 2011

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