Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by R.F. Egerton
ISBN 13: 9780387258003
Format: Hardcover (202 pages) Publisher: Springer Published: 01 May 2008
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Electron Energy-Loss Spectroscopy in the Electron Microscope
ISBN 13: 9781441995827
Format: Hardcover (503 pages) Publisher: Springer Published: 28 Sep 2011