Buy Used Electronics Engineering CDs

Principles of Functional Verification

by Andreas S. Meyer

ISBN 13: 9780750676175

Format: Illustrated (216 pages)
Publisher: Newnes
Published: 05 Dec 2003

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Test and Measurement: Know It All (Newnes Know It All)

by Jon S. Wilson,Stuart Ball,Creed Huddleston,Edward Ramsden,Dogan Ibrahim

ISBN 13: 9781856175302

Format: Illustrated (912 pages)
Publisher: Newnes
Published: 27 Oct 2008

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Digital Filters (Dover Civil and Mechanical Engineering)

by Richard W. Hamming

ISBN 13: 9780486650883

Format: Paperback (296 pages)
Publisher: Dover Publications Inc.
Published: 01 Jun 1999

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Optics of Liquid Crystal Displays: 67 (Wiley Series in Pure and Applied Optics)

by Pochi Yeh, Claire Gu

ISBN 13: 9780470181768

Format: Hardcover (792 pages)
Publisher: Wiley
Published: 24 Nov 2009

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Rf and Baseband Techniques for Software Defined Radio (Artech House Mobile Communications)

by Peter B. Kenington

ISBN 13: 9781580537933

Format: Illustrated (352 pages)
Publisher: Artech House
Published: 01 Jul 2005

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Optical Switching Networks

by Martin Maier

ISBN 13: 9780521868006

Format: Hardcover (244 pages)
Publisher: Cambridge University Press
Published: 11 Feb 2008

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Oxide and Nitride Semiconductors: Processing, Properties, and Applications: 12 (Advances in Materials Research)

by Takafumi Yao,Soon-Ku Hong

ISBN 13: 9783540888468

Format: Hardcover (532 pages)
Publisher: Springer
Published: 29 Apr 2009

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Computer Arithmetics for Nanoelectronics

by Vlad P. Shmerko, Svetlana N. Yanushkevich, Sergey Edward Lyshevski

ISBN 13: 9781420066210

Format: Hardcover (780 pages)
Publisher: CRC Press
Published: 02 Feb 2009

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Contamination and ESD Control in High-Technology Manufacturing (IEEE Press)

by Roger W. Welker

ISBN 13: 9780471414520

Format: Illustrated (514 pages)
Publisher: Wiley-IEEE Press
Published: 03 Oct 2006

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The Joint Spectral Radius: Theory and Applications: 385 (Lecture Notes in Control and Information Sciences)

by Raphaël Jungers

ISBN 13: 9783540959793

Format: Paperback (146 pages)
Publisher: Springer
Published: 19 May 2009

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Wireless Security: Know It All (Newnes Know It All)

by Steve Rackley, Alan Bensky, Chris Hurley, Tony Bradley, Praphul Chandra, Frank Thornton, John Rittinghouse PhD CISM Captain, James F. Ransome PhD CISM CISSP, Timothy Stapko, George L Stefanek, Chris Lanthem, Jon S. Wilson

ISBN 13: 9781856175296

Format: Paperback (744 pages)
Publisher: Newnes
Published: 13 Nov 2008

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Signal Processing, Image Processing and Pattern Recognition,: International Conference, SIP 2009, Held as Part of the Future Generation Information ... in Computer and Information Science)

by Dominik Slezak, Byeong-Ho Kang, Sankar Pal, Junzhong Gu, Hideo Kuroda, Kim, Tai-hoon

ISBN 13: 9783642105456

Format: Paperback (330 pages)
Publisher: Springer
Published: 24 Nov 2009

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