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Nokia Smartphone Hacks: Tips & Tools for Your Smallest Computer Nokia Smartphone Hacks: Tips & Tools for Your Smallest Computer by Michael Juntao Yuan

Nokia Smartphone Hacks: Tips & Tools for Your Smallest Computer

by Michael Juntao Yuan


ISBN 13: 9780596009618

Format: Paperback (408 pages)
Publisher: O'Reilly Media
Published: 25 Jul 2005

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Image Processing and Mathematical Morphology Image Processing and Mathematical Morphology by Frank Y. Shih

Image Processing and Mathematical Morphology

by Frank Y. Shih


ISBN 13: 9781420089431

Format: Hardcover (439 pages)
Publisher: CRC Press
Published: 23 Mar 2009

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Linear Electric Actuators Linear Electric Actuators by I. Boldea

Linear Electric Actuators

by I. Boldea


ISBN 13: 9780521020329

Format: Paperback (248 pages)
Publisher: Cambridge University Press
Published: 21 Aug 2008

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Schaum's Outline of Basic Mathematics for Electricity and Electronics (SCHAUMS' ENGINEERING) Schaum's Outline of Basic Mathematics for Electricity and Electronics (SCHAUMS' ENGINEERING) by Arthur Beiser; Emeritus

Schaum's Outline of Basic Mathematics for Electricity and Electronics (SCHAUMS' ENGINEERING)

by Arthur Beiser; Emeritus


ISBN 13: 9780070044395

Format: Illustrated (224 pages)
Publisher: McGraw Hill
Published: 01 Apr 1993

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The Audio Dictionary The Audio Dictionary by Glenn D. White, Gary J. Louie

The Audio Dictionary

by Glenn D. White, Gary J. Louie


ISBN 13: 9780295984988

Format: Paperback (504 pages)
Publisher: University of Washington Press
Published: 08 Jul 2005

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Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices) Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices) by J.F. Whitfield

Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices)

by J.F. Whitfield


ISBN 13: 9780863419331

Format: Illustrated (400 pages)
Publisher: Institution of Electrical Engineers
Published: 27 Feb 2009
Other Format: Illustrated, Paperback

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New : $72.42  
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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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Electromagnetic Compatibility for Device Design and System Integration Electromagnetic Compatibility for Device Design and System Integration by Karl-Heinz Gonschorek,Ralf Vick

Electromagnetic Compatibility for Device Design and System Integration

by Karl-Heinz Gonschorek,Ralf Vick


ISBN 13: 9783642032899

Format: Hardcover (482 pages)
Publisher: Springer
Published: 01 Oct 2009

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New : $191.47  
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