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Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy by José A. Gutierrez,Brian S.R. Armstrong

Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

by José A. Gutierrez,Brian S.R. Armstrong


ISBN 13: 9781846289125

Format: Hardcover (162 pages)
Publisher: Springer
Published: 23 Oct 2007

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