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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) by Adam Foster,Werner A. Hofer

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by Adam Foster,Werner A. Hofer


ISBN 13: 9780387400907

Format: Hardcover (295 pages)
Publisher: Springer
Published: 07 Aug 2006

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