Buy Used Electronics & Communications Engineering CDs

CRC Press RFID in LOGISTICS A Practical Introduction

by Erick C. Jones,Christopher A. Chung

ISBN 13: 9780849385261

Format: Illustrated (520 pages)
Publisher: CRC Press
Published: 17 Jan 2008

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Computer Relaying for Power Sy (Rsp)

by Phadke

ISBN 13: 9780470057131

Format: Illustrated (346 pages)
Publisher: John Wiley & Sons
Published: 17 Jul 2009

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Quadrupedal Locomotion: An Introduction to the Control of Four-legged Robots

by Pablo González de Santos,Elena Garcia,Joaquin Estremera

ISBN 13: 9781846283062

Format: Illustrated (282 pages)
Publisher: Springer
Published: 20 Apr 2006

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Introductory Circuits

by Robert Spence

ISBN 13: 9780470779712

Format: Illustrated (256 pages)
Publisher: Wiley
Published: 05 Sep 2008

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A First Course in Digital Communications

by Ha H. Nguyen,Ed Shwedyk

ISBN 13: 9780521876131

Format: Hardcover (562 pages)
Publisher: Cambridge University Press
Published: 28 May 2009

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Digital Signal Processing: Concepts and Applications

by Bernard Mulgrew,Peter Grant,John Thompson

ISBN 13: 9780333963562

Format: Paperback (408 pages)
Publisher: Palgrave
Published: 09 Sep 2002
Other Format: Paperback

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Adaptive Filters (IEEE Press)

by Ali H. Sayed

ISBN 13: 9780470253885

Format: Illustrated (824 pages)
Publisher: Wiley-IEEE Press
Published: 20 May 2008

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Language-driven Exploration and Implementation of Partially Re-configurable ASIPs

by Anupam Chattopadhyay,Rainer Leupers,Heinrich Meyr

ISBN 13: 9781402092961

Format: Hardcover (216 pages)
Publisher: Springer
Published: 10 Dec 2008

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Maxwell′s Equations (Wiley - IEEE)

by Paul G. Huray

ISBN 13: 9780470542767

Format: Hardcover (312 pages)
Publisher: Wiley-IEEE Press
Published: 08 Dec 2009

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Nanosystems Design and Technology

by Giovanni DeMicheli,Yusuf Leblebici,Martin Gijs

ISBN 13: 9781441902542

Format: Hardcover (192 pages)
Publisher: Springer
Published: 01 Jul 2009

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Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics)

by Paul P. Eggermont,Vincent N. LaRiccia

ISBN 13: 9780387402673

Format: Hardcover (592 pages)
Publisher: Springer
Published: 06 Jul 2009

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System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon)

by Laung-Terng Wang

ISBN 13: 9780123739735

Format: Illustrated (896 pages)
Publisher: Morgan Kaufmann
Published: 08 Jan 2008

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