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Showing 433 to 444 of 4,652 results
New Directions in Intelligent Interactive Multimedia: 142 (Studies in Computational Intelligence) New Directions in Intelligent Interactive Multimedia: 142 (Studies in Computational Intelligence) by George A Tsihrintzis,Maria Virvou

New Directions in Intelligent Interactive Multimedia: 142 (Studies in Computational Intelligence)

by George A Tsihrintzis,Maria Virvou


ISBN 13: 9783540681267

Format: Hardcover (656 pages)
Publisher: Springer
Published: 18 Jun 2008

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Measurements, Modelling and Simulation of Dynamic Systems Measurements, Modelling and Simulation of Dynamic Systems by Edward Layer, Krzysztof Tomczyk

Measurements, Modelling and Simulation of Dynamic Systems

by Edward Layer, Krzysztof Tomczyk


ISBN 13: 9783642045875

Format: Hardcover (156 pages)
Publisher: Springer
Published: 04 Feb 2010

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Compact MOSFET Models for VLSI Design (IEEE Press) Compact MOSFET Models for VLSI Design (IEEE Press) by A. B. Bhattacharyya

Compact MOSFET Models for VLSI Design (IEEE Press)

by A. B. Bhattacharyya


ISBN 13: 9780470823422

Format: Hardcover (512 pages)
Publisher: Wiley-IEEE Press
Published: 15 May 2009

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Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices) Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices) by J.F. Whitfield

Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices)

by J.F. Whitfield


ISBN 13: 9780863419331

Format: Illustrated (400 pages)
Publisher: Institution of Electrical Engineers
Published: 27 Feb 2009
Other Format: Illustrated, Paperback

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Unofficial IEEE Brainbuster Gamebook: Mental Workouts for the Technically Inclined Unofficial IEEE Brainbuster Gamebook: Mental Workouts for the Technically Inclined by Donald R. Mack

Unofficial IEEE Brainbuster Gamebook: Mental Workouts for the Technically Inclined

by Donald R. Mack


ISBN 13: 9780780304239

Format: Paperback (148 pages)
Publisher: John Wiley & Sons
Published: 31 Jul 1992

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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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New : $209.20  
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Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics) Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics) by Paul P. Eggermont,Vincent N. LaRiccia

Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics)

by Paul P. Eggermont,Vincent N. LaRiccia


ISBN 13: 9780387402673

Format: Hardcover (592 pages)
Publisher: Springer
Published: 06 Jul 2009

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Language-driven Exploration and Implementation of Partially Re-configurable ASIPs Language-driven Exploration and Implementation of Partially Re-configurable ASIPs by Anupam Chattopadhyay,Rainer Leupers,Heinrich Meyr

Language-driven Exploration and Implementation of Partially Re-configurable ASIPs

by Anupam Chattopadhyay,Rainer Leupers,Heinrich Meyr


ISBN 13: 9781402092961

Format: Hardcover (216 pages)
Publisher: Springer
Published: 10 Dec 2008

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New : $188.90  
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Remote Control Robotics Remote Control Robotics by Craig Sayers,C. Sayers

Remote Control Robotics

by Craig Sayers,C. Sayers


ISBN 13: 9780387985978

Format: Illustrated (256 pages)
Publisher: Springer
Published: 01 Feb 1999

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New : $125.33  
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Platform Interference in Wireless Systems: Models, Measurement, and Mitigation Platform Interference in Wireless Systems: Models, Measurement, and Mitigation by Slattery

Platform Interference in Wireless Systems: Models, Measurement, and Mitigation

by Slattery


ISBN 13: 9780750687577

Format: Illustrated (288 pages)
Publisher: Newnes
Published: 13 May 2008

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New : $73.14  
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