Advances in Solid State Physics 48
by Rolf Haug
ISBN 13: 9783540858584
Format: Hardcover (363 pages) Publisher: Springer Published: 11 Dec 2008
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Design for Debugging and Validation of Embedded Systems (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Roychoudhury
ISBN 13: 9780123742308
Format: Illustrated (400 pages) Publisher: Morgan Kaufmann Published: 08 Jul 2009
Probability, Random Processes, and Ergodic Properties
by Robert M. Gray
ISBN 13: 9781441910899
Format: Hardcover (362 pages) Publisher: Springer Published: 10 Aug 2009
Surface Mount Technology with Fine Pitch Components: The manufacturing issues
by Hans Danielsson,H. Danielsson
ISBN 13: 9780412553400
Format: Illustrated (256 pages) Publisher: Springer Published: 30 Nov 1994
Telecommunications Regulation: Culture, Chaos and Interdependance Inside the Regulatory Process (Routledge Advances in Management and Business Studies)
by Clare Hall, Christopher Hood, Colin Scott
ISBN 13: 9780415199490
Format: Hardcover (264 pages) Publisher: Routledge Published: 16 Dec 1999
New Frontiers in Urban Analysis: In Honor of Atsuyuki Okabe
by Yasushi Asami, Yukio Sadahiro, Toru Ishikawa
ISBN 13: 9781439802526
Format: Illustrated (272 pages) Publisher: CRC Press Published: 03 Jul 2009
Project Portfolio Management: A View from the Management Trenches
by EPMC Inc.
ISBN 13: 9780470505366
Format: Hardcover (256 pages) Publisher: John Wiley & Sons Published: 23 Oct 2009
Language-driven Exploration and Implementation of Partially Re-configurable ASIPs
by Anupam Chattopadhyay,Rainer Leupers,Heinrich Meyr
ISBN 13: 9781402092961
Format: Hardcover (216 pages) Publisher: Springer Published: 10 Dec 2008
Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics)
by Paul P. Eggermont,Vincent N. LaRiccia
ISBN 13: 9780387402673
Format: Hardcover (592 pages) Publisher: Springer Published: 06 Jul 2009
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon)
by Laung-Terng Wang
ISBN 13: 9780123739735
Format: Illustrated (896 pages) Publisher: Morgan Kaufmann Published: 08 Jan 2008
Discrete–Signal Analysis and Design
by William E. Sabin
ISBN 13: 9780470187777
Format: Hardcover (192 pages) Publisher: Wiley-Interscience Published: 14 Mar 2008
Optical Metrology, 3rd Edition
by Kjell J. Gåsvik
ISBN 13: 9780470843000
Format: Hardcover (372 pages) Publisher: Wiley-Blackwell Published: 29 Aug 2002