Buy Used Electronics & Communications Engineering CDs

Practical Problems in VLSI Physical Design Automation

by Sung Kyu Lim

ISBN 13: 9781402066269

Format: Hardcover (300 pages)
Publisher: Springer
Published: 04 Aug 2008

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Modern Sampling Theory: Mathematics and Applications (Applied and Numerical Harmonic Analysis)

by John J. Benedetto, Paulo J.S.G. Ferreira

ISBN 13: 9780817640231

Format: Hardcover (417 pages)
Publisher: Birkhauser
Published: 01 Mar 2001

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Fundamentals of Resource Allocation in Wireless Networks: Theory and Algorithms: 3 (Foundations in Signal Processing, Communications and Networking)

by Slawomir Stanczak,Marcin Wiczanowski,Holger Boche

ISBN 13: 9783540793854

Format: Hardcover (456 pages)
Publisher: Springer
Published: 07 Jul 2009

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Electric Power Distribution Reliability (Power Engineering Willis)

by Richard E. Brown

ISBN 13: 9780849375675

Format: Illustrated (504 pages)
Publisher: CRC Press
Published: 25 Aug 2008

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Elementary SW Process Assess Improve: 29 (Practitioners)

by Khaled El Emam

ISBN 13: 9780818685231

Format: Illustrated (400 pages)
Publisher: John Wiley & Sons
Published: 27 Apr 1999

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In-Vehicle Corpus and Signal Processing for Driver Behavior

by Hakan Erdogan, Kazuya Takeda, John H. L. Hansen

ISBN 13: 9780387795812

Format: Illustrated (264 pages)
Publisher: Springer
Published: 09 Dec 2008

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Secure Electronic Transactions Introduction and Technical Reference (Computing Library)

by Larry Loeb

ISBN 13: 9780890069929

Format: Hardcover (360 pages)
Publisher: Artech House Publishers
Published: 28 Feb 1998

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Language-driven Exploration and Implementation of Partially Re-configurable ASIPs

by Anupam Chattopadhyay,Rainer Leupers,Heinrich Meyr

ISBN 13: 9781402092961

Format: Hardcover (216 pages)
Publisher: Springer
Published: 10 Dec 2008

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Maxwell′s Equations (Wiley - IEEE)

by Paul G. Huray

ISBN 13: 9780470542767

Format: Hardcover (312 pages)
Publisher: Wiley-IEEE Press
Published: 08 Dec 2009

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Nanosystems Design and Technology

by Giovanni DeMicheli,Yusuf Leblebici,Martin Gijs

ISBN 13: 9781441902542

Format: Hardcover (192 pages)
Publisher: Springer
Published: 01 Jul 2009

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Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics)

by Paul P. Eggermont,Vincent N. LaRiccia

ISBN 13: 9780387402673

Format: Hardcover (592 pages)
Publisher: Springer
Published: 06 Jul 2009

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System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon)

by Laung-Terng Wang

ISBN 13: 9780123739735

Format: Illustrated (896 pages)
Publisher: Morgan Kaufmann
Published: 08 Jan 2008

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