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Electron Transport in Nanostructures and Mesoscopic Devices

by Thierry Ouisse

ISBN 13: 9781848210509

Format: Hardcover (387 pages)
Publisher: Wiley-Blackwell
Published: 21 Jul 2008

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Does Measurement Measure Up?: How Numbers Reveal and Conceal the Truth

by John M. Henshaw

ISBN 13: 9780801883750

Format: Hardcover (248 pages)
Publisher: The Johns Hopkins University Press
Published: 23 Mar 2006

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Nanowires and Nanobelts: Materials, Properties and Devices: Volume 2: Nanowires and Nanobelts of Functional Materials: Nanowires and Nanobelts of Functional Materials v. 2

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ISBN 13: 9780387287065

Format: Paperback (300 pages)
Publisher: Springer
Published: 16 Dec 2005

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Huygens: The Man Behind the Principle

by C. D. Andriesse

ISBN 13: 9780521850902

Format: Hardcover (466 pages)
Publisher: Cambridge University Press
Published: 25 Aug 2005

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Wizards and Scientists: Explorations in Afro-Cuban Modernity and Tradition

by Stephan Palmie

ISBN 13: 9780822328421

Format: Paperback (416 pages)
Publisher: Duke University Press
Published: 01 Apr 2002

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Optimization and Inverse Problems in Electromagnetism: Workshop on Optimization and Inverse Problems in Electromagnetism, Lodz, Poland, 12-14 September 2002

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ISBN 13: 9781402015069

Format: Hardcover (360 pages)
Publisher: Springer
Published: 30 Sep 2003

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Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)

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ISBN 13: 9783642035340

Format: Hardcover (956 pages)
Publisher: Springer
Published: 05 Mar 2010

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EMI Troubleshooting Techniques (EE Circuit Solutions)

by Michel Mardiguian

ISBN 13: 9780071344180

Format: Hardcover (300 pages)
Publisher: McGraw-Hill Professional
Published: 01 Sep 1999

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Descartes' Metaphysical Physics (Science & Its Conceptual Foundations)

by Garber

ISBN 13: 9780226282190

Format: Paperback (404 pages)
Publisher: University of Chicago Press
Published: 01 Mar 1992

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Objectivity, Invariance and Convention: Symmetry, in Physical Science

by TA Debs

ISBN 13: 9780674022980

Format: Hardcover (208 pages)
Publisher: Harvard University Press
Published: 27 Mar 2007

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ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING VIII (Series on Advances in Mathematics for Applied Sciences)

by PAVESE FRANCO ET AL

ISBN 13: 9789812839510

Format: Hardcover (424 pages)
Publisher: World Scientific Publishing
Published: 15 Jun 2009

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Experience and Prediction: An Analysis of the Foundations and the Structure of Knowledge

by Hans Reichenbach

ISBN 13: 9780268040550

Format: Paperback (456 pages)
Publisher: University of Notre Dame Press
Published: 01 May 2006

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