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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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Particle Swarm Optimization Particle Swarm Optimization by Clerc

Particle Swarm Optimization

by Clerc


ISBN 13: 9781905209040

Format: Illustrated (244 pages)
Publisher: John Wiley & Sons
Published: 08 Feb 2006

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Analysis of Radome Enclosed Antennas Analysis of Radome Enclosed Antennas by Dennis J. Kozakoff

Analysis of Radome Enclosed Antennas

by Dennis J. Kozakoff


ISBN 13: 9781596934412

Format: Unabridged (300 pages)
Publisher: Artech House
Published: 31 Dec 2009

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IMS: A New Model For Blending Applications IMS: A New Model For Blending Applications by Mark Wuthnow, Jerry Shih, Matthew Stafford

IMS: A New Model For Blending Applications

by Mark Wuthnow, Jerry Shih, Matthew Stafford


ISBN 13: 9781420092851

Format: Hardcover (368 pages)
Publisher: Auerbach Publications
Published: 28 Jul 2009

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Silicon Devices and Process Integration: Deep Submicron and Nano-Scale Technologies Silicon Devices and Process Integration: Deep Submicron and Nano-Scale Technologies by Badih El-Kareh

Silicon Devices and Process Integration: Deep Submicron and Nano-Scale Technologies

by Badih El-Kareh


ISBN 13: 9780387367989

Format: Hardcover (597 pages)
Publisher: Springer
Published: 12 Jan 2009

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Quantifying and Controlling Catastrophic Risks, Quantifying and Controlling Catastrophic Risks, by B. John Garrick

Quantifying and Controlling Catastrophic Risks,

by B. John Garrick


ISBN 13: 9780123746016

Format: Illustrated (250 pages)
Publisher: Academic Press
Published: 27 Oct 2008

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802.11 Demystified: Wi-Fi Made Easy (Telecommunications) 802.11 Demystified: Wi-Fi Made Easy (Telecommunications) by James LaRocca

802.11 Demystified: Wi-Fi Made Easy (Telecommunications)

by James LaRocca


ISBN 13: 9780071385282

Format: Paperback (291 pages)
Publisher: McGraw-Hill Inc.,US
Published: 01 Jul 2002

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Photonic Crystals: Physics and Technology Photonic Crystals: Physics and Technology by Concita Sibilia,Trevor M. Benson,Marian Marciniak,Tomasz Szoplik

Photonic Crystals: Physics and Technology

by Concita Sibilia,Trevor M. Benson,Marian Marciniak,Tomasz Szoplik


ISBN 13: 9788847008434

Format: Paperback (308 pages)
Publisher: Springer
Published: 18 Sep 2008

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Fuzzing for Software Security Testing and Quality Assurance (Artech House Information Security and Privacy) Fuzzing for Software Security Testing and Quality Assurance (Artech House Information Security and Privacy) by Ari Takanen,Jared D. Demott,Charles Miller

Fuzzing for Software Security Testing and Quality Assurance (Artech House Information Security and Privacy)

by Ari Takanen,Jared D. Demott,Charles Miller


ISBN 13: 9781596932142

Format: Illustrated (312 pages)
Publisher: Artech House
Published: 30 Jun 2008

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Non-Linear Electromechanics (Foundations of Engineering Mechanics) Non-Linear Electromechanics (Foundations of Engineering Mechanics) by Dmitry Skubov,Kamil Shamsutdinovich Khodzhaev

Non-Linear Electromechanics (Foundations of Engineering Mechanics)

by Dmitry Skubov,Kamil Shamsutdinovich Khodzhaev


ISBN 13: 9783540251392

Format: Hardcover (416 pages)
Publisher: Springer
Published: 01 Apr 2008

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New : $171.26  
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