Buy Used and New Electrical Books

Results for Electrical

Showing 445 to 456 of 2,404 results
Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility by Sonia Ben Dhia,Mohamed Ramdani,Etienne Sicard

Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility

by Sonia Ben Dhia,Mohamed Ramdani,Etienne Sicard


ISBN 13: 9780387266008

Format: Illustrated (488 pages)
Publisher: Springer
Published: 21 Dec 2005

Save for later

 
New : $154.86  
New : $154.86
Electrical Safety Engineering Electrical Safety Engineering by W. Fordham-Cooper

Electrical Safety Engineering

by W. Fordham-Cooper


ISBN 13: 9780750639651

Format: Illustrated (584 pages)
Publisher: Newnes
Published: 17 Feb 1998

Save for later

 
New : $84.82  
New : $84.82
Foundations of Medical Imaging C Foundations of Medical Imaging C by Cho,JONES,SINGH

Foundations of Medical Imaging C

by Cho,JONES,SINGH


ISBN 13: 9780471545736

Format: Hardcover (604 pages)
Publisher: John Wiley & Sons
Published: 17 Sep 1993

Save for later

 
New : $233.68  
New : $233.68
Economic Evaluation of Projects in the Electricity Supply Industry (IEE Power and Energy Series) Economic Evaluation of Projects in the Electricity Supply Industry (IEE Power and Energy Series) by Hisham Khatib

Economic Evaluation of Projects in the Electricity Supply Industry (IEE Power and Energy Series)

by Hisham Khatib


ISBN 13: 9780863413049

Format: Hardcover (210 pages)
Publisher: Institution of Engineering and Technology
Published: 11 Jul 2003

Save for later

 
New : $114.99  
New : $114.99
Pedestrian Dynamics Pedestrian Dynamics by Pushkin Kachroo

Pedestrian Dynamics

by Pushkin Kachroo


ISBN 13: 9781439805190

Format: Hardcover (169 pages)
Publisher: CRC Press
Published: 24 Mar 2009

Save for later

 
New : $117.89  
New : $117.89
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

Save for later

 
New : $188.82  
New : $188.82
Particle Swarm Optimization Particle Swarm Optimization by Clerc

Particle Swarm Optimization

by Clerc


ISBN 13: 9781905209040

Format: Illustrated (244 pages)
Publisher: John Wiley & Sons
Published: 08 Feb 2006

Save for later

 
New : $164.09  
New : $164.09
Analysis of Radome Enclosed Antennas Analysis of Radome Enclosed Antennas by Dennis J. Kozakoff

Analysis of Radome Enclosed Antennas

by Dennis J. Kozakoff


ISBN 13: 9781596934412

Format: Unabridged (300 pages)
Publisher: Artech House
Published: 31 Dec 2009

Save for later

 
New : $130.88  
New : $130.88