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Y7 Energy at Work Paper (SCIENCE AT WORK KEYSTAGE 3) Y7 Energy at Work Paper (SCIENCE AT WORK KEYSTAGE 3) by George Snape, David Rowlands

Y7 Energy at Work Paper (SCIENCE AT WORK KEYSTAGE 3)

by George Snape, David Rowlands


ISBN 13: 9780582247161

Format: Paperback (24 pages)
Publisher: Longman
Published: 01 Nov 1995
Other Format: Paperback

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VHDL (McGraw-Hill Series on Computer Engineering) VHDL (McGraw-Hill Series on Computer Engineering) by Douglas L. Perry

VHDL (McGraw-Hill Series on Computer Engineering)

by Douglas L. Perry


ISBN 13: 9780071136037

Format: Paperback (352 pages)
Publisher: McGraw-Hill Inc.,US
Published: Jul 1995
Other Format: Hardcover

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Electrical and Electronic Engineering Principles: A Ready Reference Electrical and Electronic Engineering Principles: A Ready Reference by J. O. Bird

Electrical and Electronic Engineering Principles: A Ready Reference

by J. O. Bird


ISBN 13: 9780582413993

Format: Paperback (144 pages)
Publisher: Longman Higher Education
Published: 26 Oct 1987

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Electronic Payment Systems (Artech House Computer Security Series) Electronic Payment Systems (Artech House Computer Security Series) by Donal Omahony,Michael Pierce,Hitesh Tewari

Electronic Payment Systems (Artech House Computer Security Series)

by Donal Omahony,Michael Pierce,Hitesh Tewari


ISBN 13: 9781580532686

Format: Hardcover (360 pages)
Publisher: Artech House
Published: 31 Aug 2001

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New : $114.66  
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Linear Electric Actuators Linear Electric Actuators by I. Boldea

Linear Electric Actuators

by I. Boldea


ISBN 13: 9780521020329

Format: Paperback (248 pages)
Publisher: Cambridge University Press
Published: 21 Aug 2008

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Gasification Gasification by Higman

Gasification

by Higman


ISBN 13: 9780750685283

Format: Illustrated (392 pages)
Publisher: Gulf Professional Publishing
Published: 31 Mar 2008

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New : $111.01  
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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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Particle Swarm Optimization Particle Swarm Optimization by Clerc

Particle Swarm Optimization

by Clerc


ISBN 13: 9781905209040

Format: Illustrated (244 pages)
Publisher: John Wiley & Sons
Published: 08 Feb 2006

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New : $170.57  
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