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Wireless Security: Know It All (Newnes Know It All) Wireless Security: Know It All (Newnes Know It All) by Steve Rackley, Alan Bensky, Chris Hurley, Tony Bradley, Praphul Chandra, Frank Thornton, John Rittinghouse PhD CISM Captain, James F. Ransome PhD CISM CISSP, Timothy Stapko, George L Stefanek, Chris Lanthem, Jon S. Wilson

Wireless Security: Know It All (Newnes Know It All)

by Steve Rackley, Alan Bensky, Chris Hurley, Tony Bradley, Praphul Chandra, Frank Thornton, John Rittinghouse PhD CISM Captain, James F. Ransome PhD CISM CISSP, Timothy Stapko, George L Stefanek, Chris Lanthem, Jon S. Wilson


ISBN 13: 9781856175296

Format: Paperback (744 pages)
Publisher: Newnes
Published: 13 Nov 2008

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Control System Design: An Introduction to State-Space Methods (Dover Books on Electrical Engineering) Control System Design: An Introduction to State-Space Methods (Dover Books on Electrical Engineering) by Bernard Friedland,Jourdain Jourdain

Control System Design: An Introduction to State-Space Methods (Dover Books on Electrical Engineering)

by Bernard Friedland,Jourdain Jourdain


ISBN 13: 9780486442785

Format: Illustrated (528 pages)
Publisher: Dover Publications Inc
Published: 27 May 2005

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Wireless Security (RSA Press) Wireless Security (RSA Press) by Merrit Maxim,David Pollino

Wireless Security (RSA Press)

by Merrit Maxim,David Pollino


ISBN 13: 9780072222869

Format: Illustrated (352 pages)
Publisher: McGraw-Hill
Published: 01 May 2002

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Kalman Filter Primer: 186 (Statistics, Textbooks and Monographs) Kalman Filter Primer: 186 (Statistics, Textbooks and Monographs) by Randall L. Eubank

Kalman Filter Primer: 186 (Statistics, Textbooks and Monographs)

by Randall L. Eubank


ISBN 13: 9780824723651

Format: Hardcover (200 pages)
Publisher: Chapman and Hall/CRC
Published: 29 Nov 2005

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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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Newnes Electrical Pocket Book (Newnes Pocket Books) Newnes Electrical Pocket Book (Newnes Pocket Books) by E A Reeves,Martin Heathcote

Newnes Electrical Pocket Book (Newnes Pocket Books)

by E A Reeves,Martin Heathcote


ISBN 13: 9780750647588

Format: Illustrated (512 pages)
Publisher: Routledge
Published: 17 Dec 2002
Other Format: Hardcover, Paperback

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New : $45.79  
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Analysis of Radome Enclosed Antennas Analysis of Radome Enclosed Antennas by Dennis J. Kozakoff

Analysis of Radome Enclosed Antennas

by Dennis J. Kozakoff


ISBN 13: 9781596934412

Format: Unabridged (300 pages)
Publisher: Artech House
Published: 31 Dec 2009

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New : $133.56  
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Particle Swarm Optimization Particle Swarm Optimization by Clerc

Particle Swarm Optimization

by Clerc


ISBN 13: 9781905209040

Format: Illustrated (244 pages)
Publisher: John Wiley & Sons
Published: 08 Feb 2006

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