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The Exploit: A Theory of Networks (Electronic Mediations) The Exploit: A Theory of Networks (Electronic Mediations) by Alexander R. Galloway,Eugene Thacker

The Exploit: A Theory of Networks (Electronic Mediations)

by Alexander R. Galloway,Eugene Thacker


ISBN 13: 9780816650446

Format: Paperback (256 pages)
Publisher: University Of Minnesota Press
Published: 01 Oct 2007

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CCTV for Security Professionals CCTV for Security Professionals by Alan Matchett

CCTV for Security Professionals

by Alan Matchett


ISBN 13: 9780750673037

Format: Hardcover (352 pages)
Publisher: A Butterworth-Heinemann Title
Published: 10 Jan 2003

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New : $74.44  
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Build Your Own Combat Robot (How to) Build Your Own Combat Robot (How to) by Pete Miles,Tom Carroll

Build Your Own Combat Robot (How to)

by Pete Miles,Tom Carroll


ISBN 13: 9780072194647

Format: Illustrated (404 pages)
Publisher: McGraw-Hill/OsborneMedia
Published: 01 Mar 2002

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Design and Verification of Microprocessor Systems for High-Assurance Applications Design and Verification of Microprocessor Systems for High-Assurance Applications by David S. Hardin

Design and Verification of Microprocessor Systems for High-Assurance Applications

by David S. Hardin


ISBN 13: 9781441915382

Format: Hardcover (452 pages)
Publisher: Springer
Published: 15 Mar 2010

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New : $188.83  
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Metamaterials Handbook Metamaterials Handbook by Filippo Capolino

Metamaterials Handbook

by Filippo Capolino


ISBN 13: 9781420053623

Format: Hardcover (1736 pages)
Publisher: CRC Press
Published: 27 Oct 2009

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Light-Emitting Diodes Light-Emitting Diodes by E. Fred Schubert

Light-Emitting Diodes

by E. Fred Schubert


ISBN 13: 9780521865388

Format: Illustrated (434 pages)
Publisher: Cambridge University Press
Published: 08 Jun 2006

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New : $145.85  
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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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New : $207.08  
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