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Results for Cartography, Geodesy & Geographic Information Systems

Showing 109 to 120 of 244 results
Errant Eye: Poetry and Topography in Early Modern France Errant Eye: Poetry and Topography in Early Modern France by Tom Conley

Errant Eye: Poetry and Topography in Early Modern France

by Tom Conley


ISBN 13: 9780816669653

Format: Paperback (264 pages)
Publisher: University of Minnesota Press
Published: 04 Jan 2011

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New : $36.60  
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Airborne and Terrestrial Laser Scanning Airborne and Terrestrial Laser Scanning by George Vosselman,Hans-Gerd Maas

Airborne and Terrestrial Laser Scanning

by George Vosselman,Hans-Gerd Maas


ISBN 13: 9781904445876

Format: Hardcover (336 pages)
Publisher: Whittles Publishing
Published: 12 Feb 2010

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New : $81.09  
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Maps – Finding Our Place in the World Maps – Finding Our Place in the World by James R Akerman,Robert W Karrow

Maps – Finding Our Place in the World

by James R Akerman,Robert W Karrow


ISBN 13: 9780226010755

Format: Illustrated (336 pages)
Publisher: University of Chicago Press
Published: 16 Nov 2007

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New : $90.79  
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Understanding the Navstar: GPS, GIS, and IVHS: 0000 (Electrical Engineering) Understanding the Navstar: GPS, GIS, and IVHS: 0000 (Electrical Engineering) by Tom Logsdon

Understanding the Navstar: GPS, GIS, and IVHS: 0000 (Electrical Engineering)

by Tom Logsdon


ISBN 13: 9780442020545

Format: Hardcover (356 pages)
Publisher: Springer
Published: 31 Oct 1995

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New : $116.28  
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Eurasian Arctic Land Cover and Land Use in a Changing Climate Eurasian Arctic Land Cover and Land Use in a Changing Climate by

Eurasian Arctic Land Cover and Land Use in a Changing Climate

by


ISBN 13: 9789048191178

Format: Hardcover (306 pages)
Publisher: Springer
Published: 27 Oct 2010

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New : $115.97  
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Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy by José A. Gutierrez,Brian S.R. Armstrong

Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

by José A. Gutierrez,Brian S.R. Armstrong


ISBN 13: 9781846289125

Format: Hardcover (162 pages)
Publisher: Springer
Published: 23 Oct 2007

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New : $114.03  
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