Writing Testbenches: Functional Verification of HDL Models
by Janick Bergeron
ISBN 13: 9781402074011
Format: Hardcover (512 pages) Publisher: Springer Published: 28 Feb 2003
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Introductory Semiconductor Device Physics
by Greg Parker
ISBN 13: 9780750310215
Format: Paperback (286 pages) Publisher: Taylor & Francis Published: 30 Sep 2004 Other Format: Paperback
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
by Rajesh Garg,Sunil P. Khatri
ISBN 13: 9781441909305
Format: Hardcover (212 pages) Publisher: Springer Published: 18 Nov 2009
MEMS Vibratory Gyroscopes: Structural Approaches to Improve Robustness (MEMS Reference Shelf)
by Cenk Acar,Andrei Shkel
ISBN 13: 9780387095356
Format: Hardcover (260 pages) Publisher: Springer Published: 28 Nov 2008
The Designer's Guide to Verilog-AMS (The Designer's Guide Book Series)
by Ken Kundert,Olaf Zinke
ISBN 13: 9781402080449
Format: Hardcover (270 pages) Publisher: Springer Published: 28 Jun 2004
The Verilog® Hardware Description Language
by Donald Thomas,Philip Moorby
ISBN 13: 9780387849300
Format: Paperback (386 pages) Publisher: Springer Published: 27 Oct 2008
Smart Cameras
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ISBN 13: 9781441909527
Format: Hardcover (404 pages) Publisher: Springer Published: 07 Dec 2009
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
by Andrei Pavlov,Manoj Sachdev
ISBN 13: 9781402083624
Format: Hardcover (212 pages) Publisher: Springer Published: 21 Jun 2008
Minimizing and Exploiting Leakage in VLSI Design
by Nikhil Jayakumar,Suganth Paul,Rajesh Garg,Kanupriya Gulati,Sunil P. Khatri
ISBN 13: 9781441909497
Format: Hardcover (214 pages) Publisher: Springer Published: 09 Dec 2009
Superior-Order Curvature-Correction Techniques for Voltage References
by Cosmin Radu Popa
ISBN 13: 9781441904157
Format: Hardcover (179 pages) Publisher: Springer Published: 26 Jun 2009
CMOS Capacitive Sensors for Lab-on-Chip Applications: A Multidisciplinary Approach (Analog Circuits and Signal Processing)
by Ebrahim Ghafar-Zadeh,Mohamad Sawan
ISBN 13: 9789048137268
Format: Hardcover (146 pages) Publisher: Springer Published: 22 Mar 2010
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
ISBN 13: 9781441909374
Format: Hardcover (171 pages) Publisher: Springer Published: 11 Nov 2009