Electro Static Discharge: Understand, Simulate, and Fix ESD Problems
by Michel Mardiguian
ISBN 13: 9780470397046
Format: Illustrated (320 pages) Publisher: Wiley-IEEE Press Published: 23 Oct 2009
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Security in Embedded Devices (Embedded Systems)
by Catherine H. Gebotys
ISBN 13: 9781441915290
Format: Hardcover (297 pages) Publisher: Springer Published: 16 Dec 2009
Pipelined ADC Design and Enhancement Techniques (Analog Circuits and Signal Processing)
by Imran Ahmed
ISBN 13: 9789048186518
Format: Hardcover (240 pages) Publisher: Springer Published: 19 Mar 2010
Efficient Test Methodologies for High-Speed Serial Links: 51 (Lecture Notes in Electrical Engineering)
by Dongwoo Hong, Kwang-Ting Cheng
ISBN 13: 9789048134427
Format: Hardcover (98 pages) Publisher: Springer Published: 07 Dec 2009
Problems and Solutions in Electronics
by R. Loxton
ISBN 13: 9780412578205
Format: Paperback (264 pages) Publisher: Springer Published: 13 Jun 2008
Circuit Simulation with SPICE OPUS: Theory and Practice (Modeling and Simulation in Science, Engineering and Technology)
by Tadej Tuma, Árpád Buermen
ISBN 13: 9780817648664
Format: Illustrated (415 pages) Publisher: Birkhäuser Published: 06 Jul 2009
Linear Systems
by Panos J. Antsaklis,Anthony N. Michel
ISBN 13: 9780817644345
Format: Hardcover (670 pages) Publisher: Birkhauser Published: 01 Dec 2005
Design and Realizations of Miniaturized Fractal Microwave and RF Filters
by Pierre Jarry, Jacques Beneat
ISBN 13: 9780470487815
Format: Hardcover (208 pages) Publisher: Wiley Published: 24 Nov 2009
Digital Systems Testing Revised
by Abramovici,Breuer MA,Friedman AD
ISBN 13: 9780780310629
Format: Illustrated (672 pages) Publisher: John Wiley & Sons Published: 13 Sep 1994
Superior-Order Curvature-Correction Techniques for Voltage References
by Cosmin Radu Popa
ISBN 13: 9781441904157
Format: Hardcover (179 pages) Publisher: Springer Published: 26 Jun 2009
CMOS Capacitive Sensors for Lab-on-Chip Applications: A Multidisciplinary Approach (Analog Circuits and Signal Processing)
by Ebrahim Ghafar-Zadeh,Mohamad Sawan
ISBN 13: 9789048137268
Format: Hardcover (146 pages) Publisher: Springer Published: 22 Mar 2010
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
ISBN 13: 9781441909374
Format: Hardcover (171 pages) Publisher: Springer Published: 11 Nov 2009