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Introductory Circuits Introductory Circuits by Robert Spence

Introductory Circuits

by Robert Spence


ISBN 13: 9780470779712

Format: Illustrated (256 pages)
Publisher: Wiley
Published: 05 Sep 2008

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Carbon Nanotube Electronics (Integrated Circuits and Systems) Carbon Nanotube Electronics (Integrated Circuits and Systems) by Ali Javey,Jing Kong

Carbon Nanotube Electronics (Integrated Circuits and Systems)

by Ali Javey,Jing Kong


ISBN 13: 9780387368337

Format: Illustrated (280 pages)
Publisher: Springer
Published: 12 Mar 2009

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New : $203.71  
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Practical Problems in VLSI Physical Design Automation Practical Problems in VLSI Physical Design Automation by Sung Kyu Lim

Practical Problems in VLSI Physical Design Automation

by Sung Kyu Lim


ISBN 13: 9781402066269

Format: Hardcover (300 pages)
Publisher: Springer
Published: 04 Aug 2008

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New : $174.73  
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Build Your Own Combat Robot (How to) Build Your Own Combat Robot (How to) by Pete Miles,Tom Carroll

Build Your Own Combat Robot (How to)

by Pete Miles,Tom Carroll


ISBN 13: 9780072194647

Format: Illustrated (404 pages)
Publisher: McGraw-Hill/OsborneMedia
Published: 01 Mar 2002

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New : $22.17  
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Design and Verification of Microprocessor Systems for High-Assurance Applications Design and Verification of Microprocessor Systems for High-Assurance Applications by David S. Hardin

Design and Verification of Microprocessor Systems for High-Assurance Applications

by David S. Hardin


ISBN 13: 9781441915382

Format: Hardcover (452 pages)
Publisher: Springer
Published: 15 Mar 2010

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New : $224.78  
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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III


ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009

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