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Low Power Hardware Synthesis from Concurrent Action-Oriented Specifications Low Power Hardware Synthesis from Concurrent Action-Oriented Specifications by Gaurav Singh,Sandeep Kumar Shukla

Low Power Hardware Synthesis from Concurrent Action-Oriented Specifications

by Gaurav Singh,Sandeep Kumar Shukla


ISBN 13: 9781441964809

Format: Hardcover (240 pages)
Publisher: Springer
Published: 16 Aug 2010

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New : $113.08  
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Adaptive Multi-Standard RF Front-Ends: A DECT / Bluetooth Case Study (Analog Circuits and Signal Processing) Adaptive Multi-Standard RF Front-Ends: A DECT / Bluetooth Case Study (Analog Circuits and Signal Processing) by Vojkan Vidojkovic,J. van der Tang,Arjan Leeuwenburgh,Arthur H. M. van Roermund

Adaptive Multi-Standard RF Front-Ends: A DECT / Bluetooth Case Study (Analog Circuits and Signal Processing)

by Vojkan Vidojkovic,J. van der Tang,Arjan Leeuwenburgh,Arthur H. M. van Roermund


ISBN 13: 9781402065330

Format: Hardcover (194 pages)
Publisher: Springer
Published: 21 Jan 2008

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New : $113.30  
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Power Distribution Networks with On-Chip Decoupling Capacitors Power Distribution Networks with On-Chip Decoupling Capacitors by Mikhail Popovich,Andrey Mezhiba,Eby G. Friedman

Power Distribution Networks with On-Chip Decoupling Capacitors

by Mikhail Popovich,Andrey Mezhiba,Eby G. Friedman


ISBN 13: 9780387716008

Format: Hardcover (515 pages)
Publisher: Springer
Published: 16 Nov 2007

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New : $172.95  
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Processor Design: System-On-Chip Computing for ASICs and FPGAs Processor Design: System-On-Chip Computing for ASICs and FPGAs by

Processor Design: System-On-Chip Computing for ASICs and FPGAs

by


ISBN 13: 9781402055294

Format: Hardcover (528 pages)
Publisher: Springer
Published: 27 Jun 2007

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New : $173.47  
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(TM) (Frontiers in Electronic Testing) The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(TM) (Frontiers in Electronic Testing) by Francisco da Silva,Teresa McLaurin,Tom Waayers

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(TM) (Frontiers in Electronic Testing)

by Francisco da Silva,Teresa McLaurin,Tom Waayers


ISBN 13: 9780387307510

Format: Hardcover (305 pages)
Publisher: Springer
Published: 21 Aug 2006

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New : $171.91  
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