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Functional Verification Coverage Measurement and Analysis

by Andrew Piziali

ISBN 13: 9780387739922

Format: Paperback (228 pages)
Publisher: Springer
Published: 08 Oct 2007

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Time-interleaved Analog-to-Digital Converters (Analog Circuits and Signal Processing)

by Simon Louwsma,Ed van Tuijl,Bram Nauta

ISBN 13: 9789048197156

Format: Hardcover (136 pages)
Publisher: Springer
Published: 18 Sep 2010

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VLSI-Design of Non-Volatile Memories

by Giovanni Campardo,Rino Micheloni,David Novosel

ISBN 13: 9783540201984

Format: Hardcover (740 pages)
Publisher: Springer
Published: 18 Jan 2005

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Abstraction Refinement for Large Scale Model Checking (Integrated Circuits and Systems)

by Chao Wang,Gary D. Hachtel,Fabio Somenzi

ISBN 13: 9780387341552

Format: Hardcover (186 pages)
Publisher: Springer
Published: 21 Aug 2006

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Platform Based Design at the Electronic System Level: Industry Perspectives and Experiences

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ISBN 13: 9781402051371

Format: Hardcover (100 pages)
Publisher: Springer
Published: 24 Jul 2006

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Compiling Esterel

by Dumitru Potop-Butucaru,Stephen A. Edwards,Gerard Berry

ISBN 13: 9780387706269

Format: Hardcover (356 pages)
Publisher: Springer
Published: 14 May 2007

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Analog Design Centering and Sizing

by Helmut E. Graeb

ISBN 13: 9781402060038

Format: Hardcover (217 pages)
Publisher: Springer
Published: 04 Jun 2007

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Silver Metallization: Stability and Reliability (Engineering Materials and Processes)

by Daniel Adams,Terry L. Alford,James W. Mayer

ISBN 13: 9781848000261

Format: Hardcover (123 pages)
Publisher: Springer
Published: 19 Oct 2007

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Organic Photovoltaics: Concepts and Realization (Springer Series in Materials Science)

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ISBN 13: 9783540004059

Format: Hardcover (300 pages)
Publisher: Springer
Published: 23 Apr 2003

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Millimeter-Wave Integrated Circuits

by Eoin Carey,Sverre Lidholm

ISBN 13: 9780387236650

Format: Hardcover (272 pages)
Publisher: Springer
Published: 03 Jan 2005

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Transient Analysis of Electric Power Circuits Handbook

by Arieh L. Shenkman

ISBN 13: 9780387287973

Format: Hardcover (569 pages)
Publisher: Springer
Published: 22 Sep 2005

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev,José Pineda de Gyvez

ISBN 13: 9780387465463

Format: Hardcover (349 pages)
Publisher: Springer
Published: 04 Jun 2007

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