Buy Used and New Circuits Books

Results for Circuits

Showing 697 to 708 of 924 results
Compiling Esterel Compiling Esterel by Dumitru Potop-Butucaru,Stephen A. Edwards,Gerard Berry

Compiling Esterel

by Dumitru Potop-Butucaru,Stephen A. Edwards,Gerard Berry


ISBN 13: 9780387706269

Format: Hardcover (356 pages)
Publisher: Springer
Published: 14 May 2007

Save for later

 
New : $224.78  
New : $224.78
Analog Design Centering and Sizing Analog Design Centering and Sizing by Helmut E. Graeb

Analog Design Centering and Sizing

by Helmut E. Graeb


ISBN 13: 9781402060038

Format: Hardcover (217 pages)
Publisher: Springer
Published: 04 Jun 2007

Save for later

 
New : $164.84  
New : $164.84
Silver Metallization: Stability and Reliability (Engineering Materials and Processes) Silver Metallization: Stability and Reliability (Engineering Materials and Processes) by Daniel Adams,Terry L. Alford,James W. Mayer

Silver Metallization: Stability and Reliability (Engineering Materials and Processes)

by Daniel Adams,Terry L. Alford,James W. Mayer


ISBN 13: 9781848000261

Format: Hardcover (123 pages)
Publisher: Springer
Published: 19 Oct 2007

Save for later

 
New : $173.71  
New : $173.71
Millimeter-Wave Integrated Circuits Millimeter-Wave Integrated Circuits by Eoin Carey,Sverre Lidholm

Millimeter-Wave Integrated Circuits

by Eoin Carey,Sverre Lidholm


ISBN 13: 9780387236650

Format: Hardcover (272 pages)
Publisher: Springer
Published: 03 Jan 2005

Save for later

 
New : $224.28  
New : $224.28
Transient Analysis of Electric Power Circuits Handbook Transient Analysis of Electric Power Circuits Handbook by Arieh L. Shenkman

Transient Analysis of Electric Power Circuits Handbook

by Arieh L. Shenkman


ISBN 13: 9780387287973

Format: Hardcover (569 pages)
Publisher: Springer
Published: 22 Sep 2005

Save for later

 
New : $304.94  
New : $304.94
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) by Manoj Sachdev,José Pineda de Gyvez

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev,José Pineda de Gyvez


ISBN 13: 9780387465463

Format: Hardcover (349 pages)
Publisher: Springer
Published: 04 Jun 2007

Save for later

 
New : $283.89  
New : $283.89
RF Imperfections in High-rate Wireless Systems: Impact and Digital Compensation RF Imperfections in High-rate Wireless Systems: Impact and Digital Compensation by Tim Schenk

RF Imperfections in High-rate Wireless Systems: Impact and Digital Compensation

by Tim Schenk


ISBN 13: 9781402069024

Format: Hardcover (336 pages)
Publisher: Springer
Published: 11 Feb 2008

Save for later

 
New : $224.58  
New : $224.58
High-Level Modeling and Synthesis of Analog Integrated Systems (Analog Circuits and Signal Processing) High-Level Modeling and Synthesis of Analog Integrated Systems (Analog Circuits and Signal Processing) by Ewout S. J. Martens,Georges Gielen

High-Level Modeling and Synthesis of Analog Integrated Systems (Analog Circuits and Signal Processing)

by Ewout S. J. Martens,Georges Gielen


ISBN 13: 9781402068010

Format: Hardcover (297 pages)
Publisher: Springer
Published: 08 Jan 2008

Save for later

 
New : $204.68  
New : $204.68
Ingredients for Successful System Level Design Methodology Ingredients for Successful System Level Design Methodology by Hiren D. Patel,Sandeep Kumar Shukla

Ingredients for Successful System Level Design Methodology

by Hiren D. Patel,Sandeep Kumar Shukla


ISBN 13: 9781402084713

Format: Hardcover (224 pages)
Publisher: Springer
Published: 22 Jun 2008

Save for later

 
New : $174.65  
New : $174.65