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Information Modeling for Interoperable Dimensional Metrology Information Modeling for Interoperable Dimensional Metrology by Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu

Information Modeling for Interoperable Dimensional Metrology

by Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu


ISBN 13: 9781447121664

Format: Hardcover (367 pages)
Publisher: Springer
Published: 29 Aug 2011

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Quality Improvement: A Systems Perspective Quality Improvement: A Systems Perspective by William Roth

Quality Improvement: A Systems Perspective

by William Roth


ISBN 13: 9781574442366

Format: Hardcover (288 pages)
Publisher: CRC Press
Published: 18 Dec 1998

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New : $115.40  
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Critical Cleaning Processes Critical Cleaning Processes by

Critical Cleaning Processes

by


ISBN 13: 9781439828274

Format: Hardcover (560 pages)
Publisher: CRC Press
Published: 14 Apr 2011

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Fundamentals of Aluminium Metallurgy: Production, Processing and Applications Fundamentals of Aluminium Metallurgy: Production, Processing and Applications by R. Lumley

Fundamentals of Aluminium Metallurgy: Production, Processing and Applications

by R. Lumley


ISBN 13: 9781845696542

Format: Hardcover (912 pages)
Publisher: Woodhead Publishing Ltd
Published: 25 Nov 2010

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Evolutionary Design and Manufacture: Selected Papers from ACDM ’00 Evolutionary Design and Manufacture: Selected Papers from ACDM ’00 by I.C. Parmee

Evolutionary Design and Manufacture: Selected Papers from ACDM ’00

by I.C. Parmee


ISBN 13: 9781852333003

Format: Paperback (384 pages)
Publisher: Springer
Published: 12 Apr 2000

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New : $103.48  
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3D IC Stacking Technology 3D IC Stacking Technology by Banqiu Wu, Kumar, Sesh Ramaswami

3D IC Stacking Technology

by Banqiu Wu, Kumar, Sesh Ramaswami


ISBN 13: 9780071741958

Format: Hardcover (544 pages)
Publisher: McGraw-Hill Professional
Published: 12 Sep 2011

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New : $168.70  
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Microlens Arrays Microlens Arrays by Dan Daly

Microlens Arrays

by Dan Daly


ISBN 13: 9780748408931

Format: Hardcover (240 pages)
Publisher: CRC Press
Published: 23 Nov 2000

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