Applied Reliability
by Paul A. Tobias, David Trindade
ISBN 13: 9781584884668
Format: Hardcover (600 pages) Publisher: Chapman and Hall/CRC Published: 14 Sep 2011
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Handbook of Tables for Order Statistics from Lognormal Distributions with Applications
by N. Balakrishnan, W.S. Chen
ISBN 13: 9780792357124
Format: Paperback (868 pages) Publisher: Springer Published: 31 Mar 1999
The Supply Chain Manager's Problem-solver: Maximizing the Value of Collaboration and Technology (St Lucie Press Series on Resource Management)
by Charles C. Poirier
ISBN 13: 9781574443356
Format: Hardcover (256 pages) Publisher: CRC Press Published: 30 Jul 2002
Dynamic Methods for Damage Detection in Structures (CISM International Centre for Mechanical Sciences)
by
ISBN 13: 9783211999318
Format: Paperback (230 pages) Publisher: Springer Published: 19 Oct 2010
Laboratory Information Management Systems
by Christine Paszko, Elizabeth Turner
ISBN 13: 9780824705213
Format: Hardcover (242 pages) Publisher: CRC Press Published: 02 Oct 2001
Network Reliability and Resilience (SpringerBriefs in Electrical and Computer Engineering)
by Ilya Gertsbakh, Yoseph Shpungin
ISBN 13: 9783642223730
Format: Paperback (64 pages) Publisher: Springer Published: 04 Sep 2011
Reliability Technology: Principles and Practice of Failure Prevention in Electronic Systems (Quality and Reliability Engineering Series)
by Norman Pascoe
ISBN 13: 9780470749661
Format: Hardcover (416 pages) Publisher: Wiley-Blackwell Published: 18 Apr 2011
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems (Quality and Reliability Engineering Series)
by Marius Bazu,Titu Bajenescu
ISBN 13: 9780470748244
Format: Hardcover (340 pages) Publisher: Wiley-Blackwell Published: 18 Apr 2011
Statistical Process Control for Real-world Applications
by William A. Levinson
ISBN 13: 9781439820001
Format: Hardcover (272 pages) Publisher: CRC Press Published: 12 Jan 2011
Quality, Reliability and Maintenance (QRM) 2002
ISBN 13: 9781860583698
Format: Hardcover (347 pages) Publisher: Wiley-Blackwell Published: 14 Mar 2002
Reliability of Microtechnology: Interconnects, Devices and Systems
by Johan Liu,Olli Salmela,Jussi Sarkka,James E. Morris,Per-Erik Tegehall,Cristina Andersson
ISBN 13: 9781441957597
Format: Hardcover (217 pages) Publisher: Springer Published: 14 Feb 2011
Basic Statistical Tools for Improving Quality
by Chang W. Kang,Paul H. Kvam
ISBN 13: 9780470889497
Format: Paperback (244 pages) Publisher: Wiley-Blackwell Published: 20 May 2011