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Showing 61 to 72 of 203 results
Applied Reliability Applied Reliability by Paul A. Tobias, David Trindade

Applied Reliability

by Paul A. Tobias, David Trindade


ISBN 13: 9781584884668

Format: Hardcover (600 pages)
Publisher: Chapman and Hall/CRC
Published: 14 Sep 2011

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Handbook of Tables for Order Statistics from Lognormal Distributions with Applications Handbook of Tables for Order Statistics from Lognormal Distributions with Applications by N. Balakrishnan, W.S. Chen

Handbook of Tables for Order Statistics from Lognormal Distributions with Applications

by N. Balakrishnan, W.S. Chen


ISBN 13: 9780792357124

Format: Paperback (868 pages)
Publisher: Springer
Published: 31 Mar 1999

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Laboratory Information Management Systems Laboratory Information Management Systems by Christine Paszko, Elizabeth Turner

Laboratory Information Management Systems

by Christine Paszko, Elizabeth Turner


ISBN 13: 9780824705213

Format: Hardcover (242 pages)
Publisher: CRC Press
Published: 02 Oct 2001

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Network Reliability and Resilience (SpringerBriefs in Electrical and Computer Engineering) Network Reliability and Resilience (SpringerBriefs in Electrical and Computer Engineering) by Ilya Gertsbakh, Yoseph Shpungin

Network Reliability and Resilience (SpringerBriefs in Electrical and Computer Engineering)

by Ilya Gertsbakh, Yoseph Shpungin


ISBN 13: 9783642223730

Format: Paperback (64 pages)
Publisher: Springer
Published: 04 Sep 2011

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Statistical Process Control for Real-world Applications Statistical Process Control for Real-world Applications by William A. Levinson

Statistical Process Control for Real-world Applications

by William A. Levinson


ISBN 13: 9781439820001

Format: Hardcover (272 pages)
Publisher: CRC Press
Published: 12 Jan 2011

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Quality, Reliability and Maintenance (QRM) 2002 Quality, Reliability and Maintenance (QRM) 2002 by

Quality, Reliability and Maintenance (QRM) 2002

by


ISBN 13: 9781860583698

Format: Hardcover (347 pages)
Publisher: Wiley-Blackwell
Published: 14 Mar 2002

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Reliability of Microtechnology: Interconnects, Devices and Systems Reliability of Microtechnology: Interconnects, Devices and Systems by Johan Liu,Olli Salmela,Jussi Sarkka,James E. Morris,Per-Erik Tegehall,Cristina Andersson

Reliability of Microtechnology: Interconnects, Devices and Systems

by Johan Liu,Olli Salmela,Jussi Sarkka,James E. Morris,Per-Erik Tegehall,Cristina Andersson


ISBN 13: 9781441957597

Format: Hardcover (217 pages)
Publisher: Springer
Published: 14 Feb 2011

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Basic Statistical Tools for Improving Quality Basic Statistical Tools for Improving Quality by Chang W. Kang,Paul H. Kvam

Basic Statistical Tools for Improving Quality

by Chang W. Kang,Paul H. Kvam


ISBN 13: 9780470889497

Format: Paperback (244 pages)
Publisher: Wiley-Blackwell
Published: 20 May 2011

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