A Unified Statistical Methodology for Modeling Fatigue Damage
by Enrique Castillo,Alfonso Fernandez-Canteli
ISBN 13: 9781402091810
Format: Hardcover (248 pages) Publisher: Springer Published: 23 Feb 2009
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Global Perspective for Competitive Enterprise, Economy and Ecology: Proceedings of the 16th ISPE International Conference on Concurrent Engineering (Advanced Concurrent Engineering)
by Shuo-Yan Chou, Amy J. C. Trappey, Jerzy Pokojski, Shana Smith
ISBN 13: 9781848827615
Format: Hardcover (907 pages) Publisher: Springer Published: 24 Jul 2009
Justifying the Dependability of Computer-based Systems (Springer Series in Reliability Engineering): With Applications in Nuclear Engineering
by Pierre-Jacques Courtois
ISBN 13: 9781848003712
Format: Illustrated (344 pages) Publisher: Springer Published: 12 Sep 2008
Quality and Reliability in Engineering
by Tirupathi R. Chandrupatla
ISBN 13: 9780521515221
Format: Hardcover (326 pages) Publisher: Cambridge University Press Published: 12 Jan 2009
Challenges in Radiation Protection and Nuclear Safety Regulation of the Nuclear Legacy (NATO Science for Peace and Security Series C: Environmental Security)
by
ISBN 13: 9781402086328
Format: Hardcover (238 pages) Publisher: Springer Published: 15 Jul 2008
Satellite Navigation Systems:: Policy, Commercial and Technical Interaction (Space Studies)
ISBN 13: 9781402016783
Format: Hardcover (285 pages) Publisher: Springer Published: 31 Dec 2003
Taguchi on Robust Technology Development: Bringing Quality Engineering Upstream (Asme Press Series on International Advances in Design Productivity)
by Genichi Taguchi
ISBN 13: 9780791800287
Format: Hardcover (136 pages) Publisher: American Society of Mechanical Engineers,U.S. Published: 15 Mar 1993
Life Distributions: Structure of Nonparametric, Semiparametric, and Parametric Families (Springer Series in Statistics)
by Albert W. Marshall,Ingram Olkin
ISBN 13: 9780387203331
Format: Hardcover (788 pages) Publisher: Springer Published: 28 Aug 2007
Managing Risk: The Human Element
by Romney Beecher Duffey,John Walton Saull
ISBN 13: 9780470699768
Format: Hardcover (568 pages) Publisher: Wiley-Blackwell Published: 17 Oct 2008
Human Error, Safety and Systems Development: 7th IFIP WG 13.5 Working Conference, HESSD 2009, Brussels, Belgium, September 23-25, 2009, Revised ... Applications, incl. Internet/Web, and HCI)
ISBN 13: 9783642117497
Format: Paperback (102 pages) Publisher: Springer Published: 18 Feb 2010
E-maintenance
ISBN 13: 9781849962049
Format: Hardcover (511 pages) Publisher: Springer Published: 05 Sep 2010
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing)
ISBN 13: 9780387747460
Format: Hardcover (408 pages) Publisher: Springer Published: 14 Jan 2008