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Showing 73 to 84 of 173 results
Survival and Event History Analysis: A Process Point of View (Statistics for Biology and Health) Survival and Event History Analysis: A Process Point of View (Statistics for Biology and Health) by Odd Aalen,Ornulf Borgan,Hakon Gjessing

Survival and Event History Analysis: A Process Point of View (Statistics for Biology and Health)

by Odd Aalen,Ornulf Borgan,Hakon Gjessing


ISBN 13: 9780387202877

Format: Hardcover (540 pages)
Publisher: Springer
Published: 29 Aug 2008

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Industrial Statistics: Practical Methods and Guidance for Improved Performance Industrial Statistics: Practical Methods and Guidance for Improved Performance by Anand M. Joglekar

Industrial Statistics: Practical Methods and Guidance for Improved Performance

by Anand M. Joglekar


ISBN 13: 9780470497166

Format: Hardcover (263 pages)
Publisher: Wiley-Blackwell
Published: 16 Apr 2010

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Engineering Optimization: Methods and Applications Engineering Optimization: Methods and Applications by A. Ravindran,K. M. Ragsdell,G. V. Reklaitis

Engineering Optimization: Methods and Applications

by A. Ravindran,K. M. Ragsdell,G. V. Reklaitis


ISBN 13: 9780471558149

Format: Hardcover (688 pages)
Publisher: John Wiley & Sons
Published: 16 Jun 2006

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Ultrasonic Nondestructive Evaluation Systems: Models and Measurements Ultrasonic Nondestructive Evaluation Systems: Models and Measurements by Lester Schmerr,Jung-Sin Song

Ultrasonic Nondestructive Evaluation Systems: Models and Measurements

by Lester Schmerr,Jung-Sin Song


ISBN 13: 9780387490618

Format: Hardcover (550 pages)
Publisher: Springer
Published: 11 Jun 2007

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Life Cycle Reliability Engineering Life Cycle Reliability Engineering by Guangbin Yang

Life Cycle Reliability Engineering

by Guangbin Yang


ISBN 13: 9780471715290

Format: Hardcover (544 pages)
Publisher: John Wiley & Sons
Published: 20 Feb 2007

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Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures by Milo Stanisavljevi,Alexandre Schmid,Yusuf Leblebici

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

by Milo Stanisavljevi,Alexandre Schmid,Yusuf Leblebici


ISBN 13: 9781441962164

Format: Hardcover (195 pages)
Publisher: Springer
Published: 22 Oct 2010

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