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Basics of Interferometry Basics of Interferometry by P. Hariharan

Basics of Interferometry

by P. Hariharan


ISBN 13: 9780123735898

Format: Hardcover (248 pages)
Publisher: Academic Press
Published: 03 Nov 2006

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Magnetic Memory: Fundamentals and Technology Magnetic Memory: Fundamentals and Technology by Denny D. Tang,Yuan-Jen Lee

Magnetic Memory: Fundamentals and Technology

by Denny D. Tang,Yuan-Jen Lee


ISBN 13: 9780521449649

Format: Hardcover (208 pages)
Publisher: Cambridge University Press
Published: 22 Apr 2010

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The Physics of Low-dimensional Semiconductors: An Introduction The Physics of Low-dimensional Semiconductors: An Introduction by John H. Davies

The Physics of Low-dimensional Semiconductors: An Introduction

by John H. Davies


ISBN 13: 9780521484916

Format: Paperback (460 pages)
Publisher: Cambridge University Press
Published: 13 Dec 1997

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Nanotechnology for Telecommunications Nanotechnology for Telecommunications by

Nanotechnology for Telecommunications

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ISBN 13: 9781420053258

Format: Hardcover (453 pages)
Publisher: CRC Press
Published: 29 Jun 2010

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Handbook of Optofluidics Handbook of Optofluidics by

Handbook of Optofluidics

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ISBN 13: 9781420093544

Format: Hardcover (664 pages)
Publisher: CRC Press
Published: 24 Mar 2010

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New : $214.38  
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Optical Waveguide Modes: Polarization, Coupling and Symmetry Optical Waveguide Modes: Polarization, Coupling and Symmetry by Richard J. Black,Langis Gagnon

Optical Waveguide Modes: Polarization, Coupling and Symmetry

by Richard J. Black,Langis Gagnon


ISBN 13: 9780071622967

Format: Hardcover (208 pages)
Publisher: McGraw-Hill Professional
Published: 01 Apr 2010

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Nanoscopy and Multidimensional Optical Fluorescence Microscopy Nanoscopy and Multidimensional Optical Fluorescence Microscopy by

Nanoscopy and Multidimensional Optical Fluorescence Microscopy

by


ISBN 13: 9781420078862

Format: Hardcover (448 pages)
Publisher: Chapman and Hall/CRC
Published: 05 May 2010

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Electron Microscopy and Analysis Electron Microscopy and Analysis by Peter J. Goodhew,F.J. Humphreys,R. Beanland

Electron Microscopy and Analysis

by Peter J. Goodhew,F.J. Humphreys,R. Beanland


ISBN 13: 9780748409686

Format: Paperback (254 pages)
Publisher: Taylor & Francis
Published: 30 Nov 2000
Other Format: Paperback

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