Buy Used and New Microscopy Books

Low-Temperature Microscopy and Analysis

by Patrick Echlin

ISBN 13: 9780306439841

Format: Hardcover (568 pages)
Publisher: Springer
Published: 31 Mar 1992

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Scientific Computer Performance (Chapman & Hall/CRC Computational Science)

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ISBN 13: 9781439815694

Format: Hardcover (399 pages)
Publisher: CRC Press
Published: 01 Feb 2011

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Scanning Transmission Electron Microscopy: Imaging and Analysis

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ISBN 13: 9781441971999

Format: Hardcover (774 pages)
Publisher: Springer
Published: 22 Mar 2011

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Biological Low-Voltage Scanning Electron Microscopy

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ISBN 13: 9780387729701

Format: Hardcover (328 pages)
Publisher: Springer
Published: 14 Jan 2008

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Advances in Imaging and Electron Physics: 165 (Advances in Imaging & Electron Physics)

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ISBN 13: 9780123858610

Format: Hardcover (360 pages)
Publisher: Academic Press
Published: 29 Mar 2011

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Scanning Electron Microscope Optics and Spectrometer

by Anjam Khursheed

ISBN 13: 9789812836670

Format: Hardcover (416 pages)
Publisher: World Scientific Publishing Co Pte Ltd
Published: 01 Nov 2009

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Optical Fluorescence Microscopy: From the Spectral to the Nano Dimension

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ISBN 13: 9783642151743

Format: Hardcover (244 pages)
Publisher: Springer
Published: 30 Nov 2010

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Broadband Dielectric Spectroscopy

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ISBN 13: 9783540434078

Format: Hardcover (729 pages)
Publisher: Springer
Published: 13 Nov 2002

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Scientific Computing with Multicore and Accelerators (Chapman & Hall/CRC Computational Science)

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ISBN 13: 9781439825365

Format: Hardcover (514 pages)
Publisher: CRC Press
Published: 14 Dec 2010

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Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques: No. 8 (NanoScience and Technology)

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ISBN 13: 9783540740797

Format: Hardcover (525 pages)
Publisher: Springer
Published: 10 Jan 2008
Other Format: Hardcover

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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

by R.F. Egerton

ISBN 13: 9780387258003

Format: Hardcover (202 pages)
Publisher: Springer
Published: 01 May 2008

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Sample Preparation Handbook for Transmission Electron Microscopy: Methodology

by Jeanne Ayache,Luc Beaunier,Jacqueline Boumendil,Gabrielle Ehret,Danièle Laub

ISBN 13: 9780387981819

Format: Hardcover (272 pages)
Publisher: Springer
Published: 12 Jul 2010

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