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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) by Adam Foster,Werner A. Hofer

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by Adam Foster,Werner A. Hofer


ISBN 13: 9780387400907

Format: Hardcover (295 pages)
Publisher: Springer
Published: 07 Aug 2006

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System Analysis: Theory and Applications (Data and Knowledge in a Changing World) System Analysis: Theory and Applications (Data and Knowledge in a Changing World) by Mikhail Z. Zgurovsky,N.D. Pankratova

System Analysis: Theory and Applications (Data and Knowledge in a Changing World)

by Mikhail Z. Zgurovsky,N.D. Pankratova


ISBN 13: 9783540488798

Format: Hardcover (469 pages)
Publisher: Springer
Published: 03 Apr 2007

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Phase Diagrams and Heterogeneous Equilibria: A Practical Introduction (Engineering Materials and Processes) Phase Diagrams and Heterogeneous Equilibria: A Practical Introduction (Engineering Materials and Processes) by Bruno Predel,Michael Hoch,Monte J. Pool

Phase Diagrams and Heterogeneous Equilibria: A Practical Introduction (Engineering Materials and Processes)

by Bruno Predel,Michael Hoch,Monte J. Pool


ISBN 13: 9783540140115

Format: Hardcover (364 pages)
Publisher: Springer
Published: 14 Sep 2004

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Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy (Springer Laboratory) Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy (Springer Laboratory) by K. C. Khulbe,C. Y. Feng,Takeshi Matsuura

Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy (Springer Laboratory)

by K. C. Khulbe,C. Y. Feng,Takeshi Matsuura


ISBN 13: 9783540739937

Format: Hardcover (216 pages)
Publisher: Springer
Published: 17 Dec 2007

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