Elementary SW Process Assess Improve: 29 (Practitioners)
by Khaled El Emam
ISBN 13: 9780818685231
Format: Illustrated (400 pages) Publisher: John Wiley & Sons Published: 27 Apr 1999
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Embedded Linux Development Using Eclipse
by Doug Abbott
ISBN 13: 9780750686549
Format: Illustrated (264 pages) Publisher: Newnes Published: 02 Jan 2009
Intelligence in Services and Networks: Technology for Cooperative Competition: Technology for Cooperative Competition : Fourth International ... 1238 (Lecture Notes in Computer Science)
by Al Mullery,Michel Besson,Mario Campolargo,Roberta Gobbi,Rick Reed
ISBN 13: 9783540631354
Format: Paperback (500 pages) Publisher: Springer Berlin Heidelberg Published: 10 Oct 2008
Foundations of Computer Technology
by Alexander John Anderson
ISBN 13: 9780412598104
Format: Paperback (456 pages) Publisher: CRC Press Published: 08 Sep 1994
Cooperative Communications: Hardware, Channel and PHY
by Mischa Dohler,Yonghui Li
ISBN 13: 9780470997680
Format: Illustrated (464 pages) Publisher: Wiley Published: 12 Feb 2010
Next Generation Network Services: Technologies and Strategies (Electrical & Electronics Engr)
by Neill Wilkinson
ISBN 13: 9780471486671
Format: Hardcover (210 pages) Publisher: Wiley Published: 22 Mar 2002
Analysis of Radome Enclosed Antennas
by Dennis J. Kozakoff
ISBN 13: 9781596934412
Format: Unabridged (300 pages) Publisher: Artech House Published: 31 Dec 2009
A Practical Guide to Call Center Technology: Select the Right Systems for Total Customer Satisfaction
by Andrew Waite
ISBN 13: 9781578200948
Format: Paperback (504 pages) Publisher: CRC Press Published: 02 Jan 2002
Electrical Craft Principles: v. 2 (Iee) (Materials, Circuits and Devices)
by J.F. Whitfield
ISBN 13: 9780863419331
Format: Illustrated (400 pages) Publisher: Institution of Electrical Engineers Published: 27 Feb 2009 Other Format: Illustrated, Paperback
Unofficial IEEE Brainbuster Gamebook: Mental Workouts for the Technically Inclined
by Donald R. Mack
ISBN 13: 9780780304239
Format: Paperback (148 pages) Publisher: John Wiley & Sons Published: 31 Jul 1992
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12
by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III
ISBN 13: 9780471731726
Format: Hardcover (624 pages) Publisher: Wiley-IEEE Press Published: 04 Sep 2009
The Exploit: A Theory of Networks (Electronic Mediations)
by Alexander R. Galloway,Eugene Thacker
ISBN 13: 9780816650446
Format: Paperback (256 pages) Publisher: University Of Minnesota Press Published: 01 Oct 2007