Buy Used and New Electronics & Communications Engineering Books

Defects in Microelectronic Materials and Devices

by Daniel M. Fleetwood, Ronald D. Schrimpf

ISBN 13: 9781420043761

Format: Hardcover (770 pages)
Publisher: CRC Press
Published: 19 Nov 2008

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Drive Solutions: Mechatronics for Production and Logistics

by Edwin Kiel

ISBN 13: 9783540767046

Format: Illustrated (556 pages)
Publisher: Springer
Published: 10 Dec 2007

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Auditory and Visual Sensations

by Yoichi Ando, Peter Cariani

ISBN 13: 9781441901712

Format: Hardcover (340 pages)
Publisher: Springer
Published: 21 Oct 2009

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Aspects of Soft Computing, Intelligent Robotics and Control: 241 (Studies in Computational Intelligence)

by János Fodor

ISBN 13: 9783642036323

Format: Hardcover (288 pages)
Publisher: Springer
Published: 20 Aug 2009

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Basic Digital Electronics: 2 (Physics and Its Applications)

by J.A. Strong,J.A. Strong

ISBN 13: 9780412399909

Format: Paperback (232 pages)
Publisher: Springer
Published: 07 Feb 1991

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Introduction to CDMA Wireless Communications

by Mosa Ali Abu-Rgheff

ISBN 13: 9780750652520

Format: Hardcover (632 pages)
Publisher: Academic Press
Published: 01 Aug 2007

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Introduction to Magnetic Materials

by B. D. Cullity,C. D. Graham

ISBN 13: 9780471477419

Format: Hardcover (568 pages)
Publisher: Wiley-IEEE Press
Published: 19 Dec 2008

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Telecommunication Markets: Drivers and Impediments (Contributions to Economics)

by Brigitte Preissl,Justus Haucap,Peter Curwen

ISBN 13: 9783790820812

Format: Illustrated (540 pages)
Publisher: Physica
Published: 08 May 2009

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Maxwell′s Equations (Wiley - IEEE)

by Paul G. Huray

ISBN 13: 9780470542767

Format: Hardcover (312 pages)
Publisher: Wiley-IEEE Press
Published: 08 Dec 2009

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Nanosystems Design and Technology

by Giovanni DeMicheli,Yusuf Leblebici,Martin Gijs

ISBN 13: 9781441902542

Format: Hardcover (192 pages)
Publisher: Springer
Published: 01 Jul 2009

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Maximum Penalized Likelihood Estimation: Volume II: Regression: 2 (Springer Series in Statistics)

by Paul P. Eggermont,Vincent N. LaRiccia

ISBN 13: 9780387402673

Format: Hardcover (592 pages)
Publisher: Springer
Published: 06 Jul 2009

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System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon)

by Laung-Terng Wang

ISBN 13: 9780123739735

Format: Illustrated (896 pages)
Publisher: Morgan Kaufmann
Published: 08 Jan 2008

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