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Shock Waves: 26th International Symposium on Shock Waves, Volume 1 Shock Waves: 26th International Symposium on Shock Waves, Volume 1 by Klaus Hannemann,Friedrich Seiler

Shock Waves: 26th International Symposium on Shock Waves, Volume 1

by Klaus Hannemann,Friedrich Seiler


ISBN 13: 9783540851677

Format: Hardcover (828 pages)
Publisher: Springer
Published: 18 May 2009

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Metal-To-Nonmetal Transitions: 132 (Springer Series in Materials Science) Metal-To-Nonmetal Transitions: 132 (Springer Series in Materials Science) by Ronald Redmer,Bastian Holst,Friedrich Hensel

Metal-To-Nonmetal Transitions: 132 (Springer Series in Materials Science)

by Ronald Redmer,Bastian Holst,Friedrich Hensel


ISBN 13: 9783642039522

Format: Hardcover (204 pages)
Publisher: Springer
Published: 11 Mar 2010

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Principles of Lasers and Optics Principles of Lasers and Optics by William S. C. Chang

Principles of Lasers and Optics

by William S. C. Chang


ISBN 13: 9780521642293

Format: Illustrated (260 pages)
Publisher: Cambridge University Press
Published: 20 Jan 2005

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Progress in Corrosion Science and Engineering I: 46 (Modern Aspects of Electrochemistry) Progress in Corrosion Science and Engineering I: 46 (Modern Aspects of Electrochemistry) by Su-Il Pyun,Jong-Won Lee

Progress in Corrosion Science and Engineering I: 46 (Modern Aspects of Electrochemistry)

by Su-Il Pyun,Jong-Won Lee


ISBN 13: 9780387922621

Format: Hardcover (340 pages)
Publisher: Springer
Published: 15 Dec 2009

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Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection) Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection) by Ragnar Hellborg,Harry J. Whitlow,Yanwen Zhang

Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)

by Ragnar Hellborg,Harry J. Whitlow,Yanwen Zhang


ISBN 13: 9783642006227

Format: Illustrated (484 pages)
Publisher: Springer
Published: 18 Nov 2009

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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

by Patrick Echlin


ISBN 13: 9780387857305

Format: Illustrated (344 pages)
Publisher: Springer
Published: 22 Apr 2009

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