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Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics

by David G . Seiler (Editor), ZhiyongMa (Editor)

$367.76

Quantity

20 in stock

More Information

Format: Hardcover
 Pages: 1454
 Edition: 1
 Publisher: Jenny Stanford Publishing
Published: 14 Nov 2016
ISBN 10: 9814745081
ISBN 13: 9789814745086